Site map

• Home
• Platform
  • Instruments
    • FEI TITAN Themis 300
    • FEI Tecnai G2-20 twin
    • SEM JEOL JSM-7800F LV
    • SEM HITACHI SU 5000
    • SEM FLEXSEM 1000
    • Electron probe micro-analyzer CAMECA SX 100
    • Sample preparation
  • People
  • How to become a user
  • Training
  • Associated Laboratories and Partners
• Research
  • Physico-Chemical Studies of Materials
    • Natural Samples and Analogs
    • Functional Oxides
    • Catalysis
    • Metallurgy
    • Polymers/Soft Matter
    • Semiconductors/Microelectronics
  • Techniques and Methodology Development
    • Diffraction
    • EDX
    • EELS
    • Electron Tomography
    • Electron Microprobe
  • Publications
• Resources
  • Picture Gallery
  • Data Analysis Software
  • Posters
• Publications
• News and seminars
  • Archive