A new low vacuum SEM on the microscopy platform

Actualités

30 Nov 23:00 - C6 Building (Campus cité scientifique)

In December 2015, the microscopy platform has been equipped with a new scanning SEM. It is a JEOL JSM-7800F LV with a FEG source. It combines sub-nanometric spatial resolution with nanometric analytical capabilities in EDS and the possibility to work in degraded vacuum. Detailed description of the equipment.